Markov Random Fields and Karhunen-Loeve Transforms for Defect Inspection of Textile Products Proceedings of IEEE ETFA'96, Vol. 3, s. 697-703, Hawaii, 1996.

Authors: Serhat Özdemir, Aytül Erçil

Abstract: In this paper the problem of using machine vision in quality inspection of textile fabrics is considered. A model based approach with Markov Random Fields (MRF) as the texture model and a new method based on Karhunen-Loève Transforms is studied for the defect inspection of textile fabrics. The results are illustrated on real fabric images, and the real time implementation of the MRF approach on a two TMS320C40 based paralel processing system is given.

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