Subband Domain Co-occurrence matrices for Texture Defect Detection submitted to Image and Vision Computing. Journal, 1998

Authors: Ahmet Latif Amet, Aysin Ertuzun, Aytul Ercil

ABSTRACT: In this paper, a new defect detection algorithm for textured images is presented. The algorithm is based on the subband decomposition of gray level images through wavelet filters and extraction of the co-occurrence features from the subband images. Detection of defects within the inspected texture is performed by partitioning the textured image into non-overlapping subwindows and classifying each subwindow as defective or non-defective with a mahalanobis distance classifier being trained on defect free samples a priori. The experimental results demonstrating the use of this algorithm for the visual inspection of textile products obtained from the real factory environment are also presented.

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